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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
AMF™ is an advanced video analysis technique available on VIEW Micro Metrology Summit, Pinnacle, Benchmark, and Precis dimensional measurement systems. The feature uses the data collected from a normal video auto-focus step and turns it into a 3D image of a feature. In addition to 3D information, it provides height or depth measurement of multiple features of a single image. This technique can ...
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Manufactured by:VIEW Micro Metrology based inRochester, NEW YORK (USA)
CiC measurement takes “snapshots” of a part image as the part is continually moved beneath the system optics. VIEW’s exclusive CiC technique can map a large surface area, stitching together individual images so they can be analyzed as a whole. Depending on the part geometry being measured, cycle time is reduced significantly without compromising measurement ...